JEDEC JESD82-10A

DEFINITION OF THE SSTU32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007

JEDEC JESD8-24

POD12-1.2 V Pseudo Open Drain Interface
standard by JEDEC Solid State Technology Association, 08/01/2011

JEDEC JESD22-B111A

BOARD LEVEL DROP TEST METHOD OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTS
standard by JEDEC Solid State Technology Association, 11/01/2016

JEDEC JESD80

STANDARD FOR DESCRIPTION OF 2.5 V CMOS LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 11/01/1999

JEDEC JESD11

CHIP CARRIER PINOUTS STANDARDIZED FOR CMOS 4000, HC AND HCT SERIES OF LOGIC CIRCUITS
standard by JEDEC Solid State Technology Association, 12/01/1984

JEDEC JESD209-4

Low Power Double Data Rate 4 (LPDDR4)
standard by JEDEC Solid State Technology Association, 2014

JEDEC JESD22-A101D

STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
standard by JEDEC Solid State Technology Association, 07/01/2015

JEDEC JESD 24-4 (R2002)

ADDENDUM No. 4 to JESD24 – THERMAL IMPEDANCE MEASUREMENTS FOR BIPOLAR TRANSISTORS (DELTA BASE-EMITTER VOLTAGE METHOD)
Amendment by JEDEC Solid State Technology Association, 11/01/1990

JEDEC JEP156

CHIP-PACKAGE INTERACTION UNDERSTANDING, IDENTIFICATION AND EVALUATION
standard by JEDEC Solid State Technology Association, 03/01/2009

JEDEC JESD99B

TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR MICROELECTRONIC DEVICES
standard by JEDEC Solid State Technology Association, 05/01/2007