JEDEC JESD82-14A
DEFINITION OF THE SSTUB32868 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 10/01/2006
NACE ASAE-ASABE B11 CGA ICC CTA
DEFINITION OF THE SSTUB32868 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 10/01/2006
JOINT JEDEC/ECA STANDARD, DEFINING "LOW-HALOGEN" PASSIVES AND SOLID STATE DEVICES (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 08/01/2011
ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device MOdel (CDM) – Device Level
standard by JEDEC Solid State Technology Association, 04/07/2015
NUMBERING OF LIKE-NAMED TERMINAL FUNCTIONS IN SEMICONDUCTOR DEVICES AND DESIGNATION OF UNITS IN MULTIPLE-UNIT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 02/01/1987
DEFINITION OF THE SSTV16857 2.5 V, 14-BIT SSTL_2 REGISTERED BUFFER FOR DDR DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 11/01/2004
PROCESS CHARACTERIZATION GUIDELINE
standard by JEDEC Solid State Technology Association, 07/01/1998
Alpha Radiation Measurement in Electronic Materials
standard by JEDEC Solid State Technology Association, 05/01/2011
Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 03/01/2016
IC LATCH-UP TEST
standard by JEDEC Solid State Technology Association, 09/01/2010
Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products
standard by JEDEC Solid State Technology Association, 03/01/2018
LEADLESS CHIP CARRIER PINOUTS STANDARDIZED FOR LINEARS
standard by JEDEC Solid State Technology Association, 04/01/1982
POD12-1.2 V Pseudo Open Drain Interface
standard by JEDEC Solid State Technology Association, 08/01/2011