JEDEC JESD22-A120A

TEST METHOD FOR THE MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS USED IN INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 01/01/2008

JEDEC JESD 22-A117B

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 03/01/2009

JEDEC JS709B

Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products
standard by JEDEC Solid State Technology Association, 04/01/2015

JEDEC JESD22-A117D

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 08/01/2018

JEDEC JESD82-3B

DEFINITION OF THE SSTV16857 2.5 V, 14-BIT SSTL_2 REGISTERED BUFFER FOR DDR DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 11/01/2004

JEDEC JESD221

Alpha Radiation Measurement in Electronic Materials
standard by JEDEC Solid State Technology Association, 05/01/2011

JEDEC JESD220C

Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 03/01/2016

JEDEC JS709C

Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products
standard by JEDEC Solid State Technology Association, 03/01/2018

JEDEC JESD 1

LEADLESS CHIP CARRIER PINOUTS STANDARDIZED FOR LINEARS
standard by JEDEC Solid State Technology Association, 04/01/1982

JEDEC JESD82-4B

STANDARD FOR DEFINITION OF THE SSTV16859 2.5 V, 13-BIT TO 26-BIT SSTL_2 REGISTERED BUFFER FOR STACKED DDR DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2003