JEDEC JESD8-26

1.2 V High-Speed LVCMOS (HS_LVCMOS) Interface
standard by JEDEC Solid State Technology Association, 09/01/2011

JEDEC JESD234

Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices
standard by JEDEC Solid State Technology Association, 10/01/2013

JEDEC JESD8-22B

HSUL_12 LPDDR2 and LPDDR3 I/O with Optional ODT
standard by JEDEC Solid State Technology Association, 04/01/2014

JEDEC JESD8-7A

ADDENDUM No. 7 to JESD8 – 1.8 V + -0.15 V (NORMAL RANGE), AND 1.2 V – 1.95 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUIT
standard by JEDEC Solid State Technology Association, 06/01/2006

JEDEC JESD79-3-1A

Addendum No. 1 to JESD79-3 – 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600
Amendment by JEDEC Solid State Technology Association, 01/01/2013

JEDEC JESD230A

NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 10/01/2012

JEDEC JESD52

STANDARD FOR DESCRIPTION OF LOW VOLTAGE TTL-COMPATIBLE CMOS LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 11/01/1995

JEDEC JESD251

EXPANDED SERIAL PERIPHERAL INTERFACE (xSPI) FOR NON VOLATILE MEMORY DEVICES, VERSION 1.0
standard by JEDEC Solid State Technology Association, 08/01/2018

JEDEC JESD625-A

REQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES
standard by JEDEC Solid State Technology Association, 12/01/1999

JEDEC JESD33-B

STANDARD METHOD FOR MEASURING AND USING THE TEMPERATURE COEFFICIENT OF RESISTANCE TO DETERMINE THE TEMPERATURE OF A METALLIZATION LINE
standard by JEDEC Solid State Technology Association, 02/01/2004

JEDEC JESD85

METHODS FOR CALCULATING FAILURE RATES IN UNITS OF FITS
standard by JEDEC Solid State Technology Association, 07/01/2001