JEDEC JS709A
JOINT JEDEC/ECA STANDARD, DEFINING "LOW-HALOGEN" PASSIVES AND SOLID STATE DEVICES (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 05/01/2012
NACE ASAE-ASABE B11 CGA ICC CTA
JOINT JEDEC/ECA STANDARD, DEFINING "LOW-HALOGEN" PASSIVES AND SOLID STATE DEVICES (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 05/01/2012
FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING
standard by JEDEC Solid State Technology Association, 02/01/2007
TEST METHODS TO CHARACTERIZE VOIDING IN PRE-SMT BALL GRID ARRAY PACKAGES
standard by JEDEC Solid State Technology Association, 09/01/2010
A PROCEDURE FOR MEASURING P-CHANNEL MOSFET NEGATIVE BIAS TEMPERATURE INSTABILITIES
standard by JEDEC Solid State Technology Association, 11/01/2004
Byte Addressable Energy Backed Interface
standard by JEDEC Solid State Technology Association, 09/01/2019
TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION
standard by JEDEC Solid State Technology Association, 12/01/1996
PROCUREMENT STANDARD FOR KNOWN GOOD DIE (KGD)
standard by JEDEC Solid State Technology Association, 09/01/2005
EMBEDDED MULTIMEDIACARD (e*MMC)MECHANICAL STANDARD
standard by JEDEC Solid State Technology Association, 12/01/2007
DDR4 REGISTER CLOCK DRIVER (DDR4RCD01)
standard by JEDEC Solid State Technology Association, 08/01/2016
HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 11/01/2010
A PROCEDURE FOR MEASURING N-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION UNDER DC STRESS
standard by JEDEC Solid State Technology Association, 12/01/2001
GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 09/01/2010