JEDEC JESD82-7A

DEFINITION OF THE SSTU32864 1.8-V CONFIGURABLE REGISTERED BUFFER FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 10/01/2004

JEDEC JESD211

ZENER AND VOLTAGE REGULATOR DIODE RATING VERIFICATION AND CHARACTERIZATION TESTING
standard by JEDEC Solid State Technology Association, 12/01/2009

JEDEC JEP70C

Guide to Standards and Publications Relating to Quality and Reliability of Electronic Hardware
standard by JEDEC Solid State Technology Association, 10/01/2013

JEDEC JESD60A

A PROCEDURE FOR MEASURING P-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION AT MAXIMUM GATE CURRENT UNDER DC STRESS
standard by JEDEC Solid State Technology Association, 09/01/2004

JEDEC JESD 22-B108A

COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2003

JEDEC JESD284-A (R2002)

TEST METHODS FOR THE COLLECTOR-BASE TIME CONSTANT AND FOR THE RESISTIVE PART OF THE COMMON-EMITTER INPUT IMPEDANCE
standard by JEDEC Solid State Technology Association, 11/01/1963

JEDEC JESD 12-4

ADDENDUM No. 4 to JESD12 – METHOD OF SPECIFICATION OF PERFORMANCE PARAMETERS FOR CMOS SEMICUSTOM INTEGRATED CIRCUITS
Amendment by JEDEC Solid State Technology Association, 04/01/1987

JEDEC JEP110

GUIDELINES FOR THE MEASUREMENT OF THERMAL RESISTANCE OF GaAs FETS
standard by JEDEC Solid State Technology Association, 07/01/1988

JEDEC JESD82-15

STANDARD FOR DEFINITION OF CUA878 PLL CLOCK DRIVER FOR REGISTERED DDR2 DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 11/01/2005

JEDEC JESD47I.01

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 10/01/2016