JEDEC JESD557C
STATISTICAL PROCESS CONTROL SYSTEMS
standard by JEDEC Solid State Technology Association, 04/01/2015
JEDEC JEP122G
FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 10/01/2011
JEDEC JESD84-B50.1
Embedded Multi-media card (e*MMC), Electrical Standard (5.01)
standard by JEDEC Solid State Technology Association, 07/01/2014
JEDEC JESD22-B118
SEMICONDUCTOR WAFER AND DIE BACKSIDE EXTERNAL VISUAL INSPECTION
standard by JEDEC Solid State Technology Association, 03/01/2011
JEDEC JEP148B
RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 01/01/2014
JEDEC JESD214.01
CONSTANT-TEMPERATURE AGING METHOD TO CHARACTERIZE COPPER INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING
standard by JEDEC Solid State Technology Association, 08/01/2017
JEDEC JESD47J.01
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2017
JEDEC JESD 354 (R2009)
THE MEASUREMENT OF TRANSISTOR EQUIVALENT NOISE VOLTAGE AND EQUIVALENT NOISE CURRENT AT FREQUENCIES OF UP TO 20 kHz
standard by JEDEC Solid State Technology Association, 04/01/1968
JEDEC JEP123
GUIDELINE FOR MEASUREMENT OF ELECTRONIC PACKAGE INDUCTANCE AND CAPACITANCE MODEL PARAMETERS
standard by JEDEC Solid State Technology Association, 10/01/1995
JEDEC JESD 218
SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD
standard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD22-A103E
HIGH TEMPERATURE STORAGE LIFE
standard by JEDEC Solid State Technology Association, 10/01/2015
JEDEC JEP162
System Level ESD: Part II: Implementation of Effective ESD Robust Designs
standard by JEDEC Solid State Technology Association, 01/01/2013