JEDEC EIA 670

QUALITY SYSTEM ASSESSMENT (SUPERSEDES JESD39-A)
standard by JEDEC Solid State Technology Association, 06/01/1997

JEDEC JESD84-B41

MULTIMEDIACARD (MMC) ELECTRICAL STANDARD, STANDARD CAPACITY (MMCA, 4.1)
standard by JEDEC Solid State Technology Association, 06/01/2007

JEDEC JESD51-31

THERMAL TEST ENVIRONMENT MODIFICATIONS FOR MULTICHIP PACKAGES
standard by JEDEC Solid State Technology Association, 07/01/2008

JEDEC JESD659C

FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING
standard by JEDEC Solid State Technology Association, 04/01/2017

JEDEC JESD8-14A.01

1.0 V +/- 0.1 V (NORMAL RANGE) AND 0.7 V – 1.1 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2007

JEDEC JESD30F

Descriptive Designation System for Semiconductor-device Packages
standard by JEDEC Solid State Technology Association, 04/01/2013

JEDEC JEP 148A

RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 12/01/2008

JEDEC JESD3-C

STANDARD DATA TRANSFER FORMAT BETWEEN DATA PREPARATION SYSTEM AND PROGRAMMABLE LOGIC DEVICE PROGRAMMER
standard by JEDEC Solid State Technology Association, 06/01/1994

JEDEC JESD 8-20A

POD15 – 1.5 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 10/01/2009

JEDEC JEP159

PROCEDURE FOR THE EVQLUQTION OF LOW-k/METAL INTER/INTRA-LEVEL DIELECTRIC INTEGRITY
standard by JEDEC Solid State Technology Association, 08/01/2010