JEDEC JESD209-3B

Low Power Double Data Rate 3 SDRAM (LPDDR3)
standard by JEDEC Solid State Technology Association, 08/01/2013

JEDEC EIA 323 (R2002)

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 03/01/1966

JEDEC JESD31D.01

GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 09/01/2012

JEDEC JESD24-12

THERMAL IMPEDANCE MEASUREMENT FOR INSULATED GATE BIPOLAR TRANSISTORS – (Delta VCE(on) Method)
Amendment by JEDEC Solid State Technology Association, 06/01/2004

JEDEC JESD 31C

GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 09/01/2003

JEDEC JESD217.01

TEST METHODS TO CHARACTERIZE VOIDING IN PRE-SMT BALL GRID ARRAY PACKAGES
standard by JEDEC Solid State Technology Association, 10/01/2016

JEDEC JS 001

ELECTROSTATIC DISCHARGE SENSITIVITY TESTING, HUMAN BODY MODEL (HBM) – COMPONENT LEVEL
standard by JEDEC Solid State Technology Association, 04/01/2010

JEDEC JESD22-A120B

TEST METHOD FOR THE MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS USED IN ELECTRONIC DEVICES
standard by JEDEC Solid State Technology Association, 07/01/2014

JEDEC JESD77D

Terms, Definitions, and Letter Symbols for Discrete Semiconductor and Optoelectronic Devices
standard by JEDEC Solid State Technology Association, 08/01/2012

JEDEC JESD65B

DEFINITION OF SKEW SPECIFICATIONS FOR STANDARD LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 09/01/2003

JEDEC JEP152

DDR2 DIMM CLOCK SKEW MEASUREMENT PROCEDURE USING A CLOCK REFERENCE BOARD
standard by JEDEC Solid State Technology Association, 05/01/2007