JEDEC JESD51-52

Guidelines for Combining CIE 127-2007 Total Flux Measurements with Thermal Measurements of LEDs with Exposed Cooling Surface
standard by JEDEC Solid State Technology Association, 04/01/2012

JEDEC JESD89A

MEASUREMENT AND REPORTING OF ALPHA PARTICLE AND TERRESTRIAL COSMIC RAY INDUCED SOFT ERRORS IN SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 10/01/2006

JEDEC JESD79-3-2

Addendum No. 2 to JESD79-3 – 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600
Amendment by JEDEC Solid State Technology Association, 10/01/2011

JEDEC JESD89-1A

TEST METHOD FOR REAL-TIME SOFT ERROR RATE
standard by JEDEC Solid State Technology Association, 10/01/2007

JEDEC JESD213

STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) – LEAD (Pb) CONTENT
standard by JEDEC Solid State Technology Association, 03/01/2010

JEDEC JEP001-3A

FOUNDRY PROCESS QUALIFICATION GUIDELINES – PRODUCT LEVEL (Wafer Fabrication Manufacturing Sites)
standard by JEDEC Solid State Technology Association, 09/01/2018

JEDEC JES 2

TRANSISTOR, GALLIUM ARSENIDE POWER FET, GENERIC SPECIFICATION
standard by JEDEC Solid State Technology Association, 07/01/1992

JEDEC JESD218B

SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD
standard by JEDEC Solid State Technology Association, 03/01/2016