JEDEC JESD22-A108D
TEMPERATURE, BIAS, AND OPERATING LIFE
standard by JEDEC Solid State Technology Association, 11/01/2010
NACE ASAE-ASABE B11 CGA ICC CTA
TEMPERATURE, BIAS, AND OPERATING LIFE
standard by JEDEC Solid State Technology Association, 11/01/2010
MEASUREMENT OF TEMPERATURE COEFFICIENT OF VOLTAGE REGULATOR DIODES
standard by JEDEC Solid State Technology Association, 02/01/1982
ADDENDUM No. 2 to JESD35 – TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 02/01/1996
ADDENDUM No. 1 to JESD24 – METHOD FOR MEASUREMENT OF POWER DEVICE TURN-OFF SWITCHING LOSS
Amendment by JEDEC Solid State Technology Association, 10/01/1989
STANDARD FOR DESCRIPTION OF A 3.3 V, ZERO DELAY CLOCK DISTRIBUTION DEVICE COMPLIANT WITH THE JESD21-C PC133 REGISTERED DIMM SPECIFICATION
standard by JEDEC Solid State Technology Association, 07/01/2002
Graphics Double Data Rate (GDDR6) SGRAM Standard
standard by JEDEC Solid State Technology Association, 07/01/2018
COMMON FLASH INTERFACE (CFI) IDENTIFICATION CODES
standard by JEDEC Solid State Technology Association, 05/01/2004
JOINT IPC/JEDEC STANDARD FOR HANDLING, PACKING, SHIPPING AND USE OF MOISTURE/REFLOW SENSITIVE SURFACE-MOUNT DEVICES
standard by JEDEC Solid State Technology Association, 12/01/2011
SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2015
Guidelines for Combining CIE 127-2007 Total Flux Measurements with Thermal Measurements of LEDs with Exposed Cooling Surface
standard by JEDEC Solid State Technology Association, 04/01/2012
MEASUREMENT AND REPORTING OF ALPHA PARTICLE AND TERRESTRIAL COSMIC RAY INDUCED SOFT ERRORS IN SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 10/01/2006
Addendum No. 2 to JESD79-3 – 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600
Amendment by JEDEC Solid State Technology Association, 10/01/2011