JEDEC JESD78E
IC LATCH-UP TEST
standard by JEDEC Solid State Technology Association, 04/01/2016
JEDEC JEP142 (R2009)
GUIDELINE FOR OBTAINING AND ACCEPTING MATERIAL FOR USE IN HYBRID / MCM PRODUCTS
standard by JEDEC Solid State Technology Association, 05/01/2002
JEDEC J-STD-048
Notification Standard for Product Discontinuance
standard by JEDEC Solid State Technology Association, 11/01/2014
JEDEC JEP84A
RECOMMENDED PRACTICE FOR MEASUREMENT OF TRANSISTOR LEAD TEMPERATURE
standard by JEDEC Solid State Technology Association, 06/01/2004
JEDEC JESD235
HIGH BANDWIDTH MEMORY (HBM) DRAM
standard by JEDEC Solid State Technology Association, 10/01/2013
JEDEC JESD22-B110B.01
Mechanical Shock – Device and Subassembly
standard by JEDEC Solid State Technology Association, 06/01/2019
JEDEC JEP134
GUIDELINES FOR PREPARING CUSTOMER-SUPPLIED BACKGROUND INFORMATION RELATING TO A SEMICONDUCTOR-DEVICE FAILURE ANALYSIS
standard by JEDEC Solid State Technology Association, 09/01/1998
JEDEC JESD 22-B110A (R2009)
SUBASSEMBLY MECHANICAL SHOCK
standard by JEDEC Solid State Technology Association, 11/01/2004
JEDEC JESD50B.01
SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT
standard by JEDEC Solid State Technology Association, 11/01/2008
JEDEC JEP114.01
GUIDELINES FOR PARTICLE IMPACT NOISE DETECTION (PIND) TESTING, OPERATOR TRAINING, AND CERTIFICATION
standard by JEDEC Solid State Technology Association, 10/01/2007
JEDEC JESD84-A41
EMBEDDED MULTIMEDIACARD (e*MMC) PRODUCT STANDARD, STANDARD CAPACITY
standard by JEDEC Solid State Technology Association, 07/01/2007
JEDEC JESD22-A108D
TEMPERATURE, BIAS, AND OPERATING LIFE
standard by JEDEC Solid State Technology Association, 11/01/2010