NACE ASAE-ASABE B11 CGA ICC CTA
ADDENDUM No. 11A.01 to JESD8 – 1.5 V +/- 0.1 V (NORMAL RANGE) AND 0.9 – 1.6 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2007
CHIP-PACKAGE INTERACTION UNDERSTANDING, IDENTIFICATION AND EVALUATION
standard by JEDEC Solid State Technology Association, 03/01/2018
JEDEC Dictionary of Terms for Solid-State Technology, Sixth Edition
standard by JEDEC Solid State Technology Association, 06/01/2013
MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES
standard by JEDEC Solid State Technology Association, 07/01/1996
RADIO FRONT END – BASEBAND DIGITAL PARALLEL (RBDP) INTERFACE
standard by JEDEC Solid State Technology Association, 03/01/2007
COLOR CODING OF DISCRETE SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 03/01/1986
TEMPERATURE CYCLING
standard by JEDEC Solid State Technology Association, 10/01/2014
REQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2012
CMOS SEMICUSTOM DESIGN GUIDELINES
standard by JEDEC Solid State Technology Association, 11/01/1991
TEST METHOD FOR ALPHA SOURCE ACCELERATED SOFT ERROR RATE
standard by JEDEC Solid State Technology Association, 10/01/2007
WIRE BOND SHEAR TEST
standard by JEDEC Solid State Technology Association, 04/01/2017
GUIDELINE FOR ASSESSING THE CURRENT-CARRYING CAPABILITY OF THE LEADS IN A POWER PACKAGE SYSTEM
standard by JEDEC Solid State Technology Association, 02/01/2003