JEDEC JESD99C
Terms, Definitions, and Letter Symbols for Microelectronic Devices
standard by JEDEC Solid State Technology Association, 12/01/2012
NACE ASAE-ASABE B11 CGA ICC CTA
Terms, Definitions, and Letter Symbols for Microelectronic Devices
standard by JEDEC Solid State Technology Association, 12/01/2012
DRIVER SPECIFICATIONS FOR 1.8 V POWER SUPPLY POINT-TO-POINT DRIVERS
standard by JEDEC Solid State Technology Association, 11/01/2004
SOLDER BALL PULL
standard by JEDEC Solid State Technology Association, 08/01/2010
Test Trace for 64 GB – 128 GB SSD
Directive by JEDEC Solid State Technology Association, 07/01/2012
PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 03/01/2010
TEMPERATURE, BIAS, AND OPERATING LIFE
standard by JEDEC Solid State Technology Association, 06/01/2005
MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS
standard by JEDEC Solid State Technology Association, 11/01/1972
SYMBOL AND LABEL FOR ELECTROSTATIC SENSITIVE DEVICES
standard by JEDEC Solid State Technology Association,
, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
standard by JEDEC Solid State Technology Association, 12/01/2015
Implementation of the Electrical Test Method for the Measurement of Real Thermal Resistance and Impedance of Light-emitting Diodes with Exposed Cooling Surface
standard by JEDEC Solid State Technology Association, 04/18/2012
Lognormal Analysis of Uncensored Data, and of Singly Right-Censored Data Utilizing the Persson and Rootzen Method
standard by JEDEC Solid State Technology Association, 08/01/2017
Component Quality Problem Analysis and Corrective Action Requirements (Including Administrative Quality Problems)
standard by JEDEC Solid State Technology Association, 07/01/2018