JEDEC JEP149
APPLICATION THERMAL DERATING METHODOLOGIES
standard by JEDEC Solid State Technology Association, 11/01/2004
NACE ASAE-ASABE B11 CGA ICC CTA
APPLICATION THERMAL DERATING METHODOLOGIES
standard by JEDEC Solid State Technology Association, 11/01/2004
BALL GRID ARRAY PINOUTS STANDARDIZED FOR 16-BIT LOGIC FUNCTIONS
standard by JEDEC Solid State Technology Association, 07/01/2001
COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 09/01/2010
ADDENDUM No. 3A to JESD8 – GUNNING TRANSCEIVER LOGIC (GTL) LOW-LEVEL, HIGH-SPEED INTERFACE STANDARD FOR DIGITAL INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 05/01/2007
Byte Addressable Energy Backed Interface
standard by JEDEC Solid State Technology Association, 09/01/2016
WIDE I/O 2 (WideIO2)
standard by JEDEC Solid State Technology Association, 08/01/2014
TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR DISCRETE SEMICONDUCTOR AND OPTOELECTRONIC DEVICES
standard by JEDEC Solid State Technology Association, 10/01/2009
TEST METHODS AND ACCEPTANCE PROCEDURES FOR THE EVALUATION OF POLYMERIC MATERIALS
standard by JEDEC Solid State Technology Association, 03/01/2018
CHARACTERIZATION AND MONITORING OF THERMAL STRESS TEST OVEN TEMPURATURES
standard by JEDEC Solid State Technology Association, 01/01/2008
Universal Flash Storage (UFS) Test
standard by JEDEC Solid State Technology Association, 03/01/2013
DEFINITION OF the SSTUA32S869 AND SSTUA32D869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007
REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATION
standard by JEDEC Solid State Technology Association, 10/01/2006