JEDEC JESD 48B
PRODUCT DISCONTINUANCE
standard by JEDEC Solid State Technology Association, 05/01/2005
JEDEC JEP 79
LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS
standard by JEDEC Solid State Technology Association, 09/01/1969
JEDEC JESD51-6
INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – FORCED CONVECTION (MOVING AIR)
standard by JEDEC Solid State Technology Association, 03/01/1999
JEDEC JESD22-A113F
PRECONDITIONING OF PLASTIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
standard by JEDEC Solid State Technology Association, 10/01/2008
JEDEC JESD79-4
DDR4 SDRAM Standard
standard by JEDEC Solid State Technology Association, 09/01/2012
JEDEC JESD22-C101E
FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
standard by JEDEC Solid State Technology Association, 12/01/2009
JEDEC JEP160
Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devices
standard by JEDEC Solid State Technology Association, 11/01/2011
JEDEC JESD224A
Universal Flash Storage (UFS) Test
standard by JEDEC Solid State Technology Association, 07/01/2017
JEDEC JESD51-50
Overview of Methodologies for the Thermal Measurement of Single- and Multi-Chip, Single- and Multi-PN-Junction Light-Emotting Diodes (LEDs)
standard by JEDEC Solid State Technology Association, 04/18/2012
JEDEC JEP132A
PROCESS CHARACTERIZATION GUIDELINE
standard by JEDEC Solid State Technology Association, 08/01/2018
JEDEC JESD230C
NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 10/01/2016
JEDEC JESD51-32
THERMAL TEST BOARD STANDARDS TO ACCOMMODATE MULTI-CHIP PACKAGES
standard by JEDEC Solid State Technology Association, 12/01/2010