JEDEC JESD 22-B114
MARK LEGIBILITY
standard by JEDEC Solid State Technology Association, 03/01/2008
NACE ASAE-ASABE B11 CGA ICC CTA
MARK LEGIBILITY
standard by JEDEC Solid State Technology Association, 03/01/2008
HIGH TEMPERATURE STORAGE LIFE
standard by JEDEC Solid State Technology Association, 12/01/2010
POD135 – 1.35 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 06/01/2019
POWER CYCLING
standard by JEDEC Solid State Technology Association, 08/01/2007
STANDARD FOR DESCRIPTION OF A 3.3 V, 18-BIT, LVTTL I/O REGISTER FOR PC133 REGISTERED DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 07/01/2001
Inspection Criteria for Microelectronic Packages and Covers
standard by JEDEC Solid State Technology Association, 05/01/2017
STANDARD FOR DESCRIPTION OF FAST CMOS TTL COMPATIBLE LOGIC
standard by JEDEC Solid State Technology Association, 01/01/1993
COUNTERFEIT ELECTRONIC PARTS: NON-PROLIFERATION FOR MANUFACTURERS
standard by JEDEC Solid State Technology Association, 03/01/2016
RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION
standard by JEDEC Solid State Technology Association, 03/01/2012
UNIVERSAL FLASH STORAGE (UFS) SECURITY EXTENSION
standard by JEDEC Solid State Technology Association, 11/01/2016
SOLID STATE DRIVE (SSD) ENDURANCE WORKLOADS
standard by JEDEC Solid State Technology Association, 09/01/2010
PHYSICAL DIMENSION
standard by JEDEC Solid State Technology Association, 06/01/2003