BS PD IEC/PAS 62276:2002
Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
standard by BSI Group, 02/05/2002
NACE ASAE-ASABE B11 CGA ICC CTA
Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
standard by BSI Group, 02/05/2002
Fibre optic interconnecting devices and passive components. Reliability. Report of high power transmission test of specified passive optical components
standard by BSI Group, 01/31/2012
Conformity assessment. Guidelines and examples of a scheme for the certification of processes
standard by BSI Group, 10/11/2019
Documentation on design automation subjects. Mathematical algorithm hardware description languages for system level modeling and verification (HDLMath)
standard by BSI Group, 01/31/2017
Electrical insulation systems (EIS). Thermal evaluation of combined liquid and solid components. Simplified test
standard by BSI Group, 05/31/2014
Method of measurement of centre beam intensity and beam angle(s) of reflector lamps
standard by BSI Group, 03/31/2010
Performance of high-voltage direct current (HVDC) systems with line-commutated converters. Dynamic conditions
standard by BSI Group, 01/31/2010
Device embedding assembly technology. Guidelines. Accelerated stress testing of passive embedded circuit boards
standard by BSI Group, 04/01/2019
Assessment of contact current related to human exposure to electric, magnetic and electromagnetic fields
standard by BSI Group, 06/13/2018
Non-linear coefficient measuring methods. Application guide
standard by BSI Group, 02/19/2003
Electrostatics. Protection of electronic devices from electrostatic phenomena. Packaging systems used in electronic manufacturing
standard by BSI Group, 12/06/2018
Maritime navigation and radiocommunication equipment and systems. Digital interfaces. Single talker and multiple listeners. Modified sentences and requirements for IEC 61162-1
standard by BSI Group, 10/27/2003